Merge pull request #3302 from ipfs/test/pin-fail-stress

add test to be run to detect future regressions in pinsets

test/sharness/x0601-pin-fail-test.sh

+#!/bin/sh
+#
+# Copyright (c) 2016 Jeromy Johnson
+# MIT Licensed; see the LICENSE file in this repository.
+#
+
+test_description="Test very large number of pins"
+
+. lib/test-lib.sh
+
+test_init_ipfs
+
+test_launch_ipfs_daemon
+
+test_expect_success "pre-test setup" '
+	printf "" > pins &&
+	ipfs pin ls --type=recursive -q > rec_pins_before
+'
+
+
+for i in `seq 9000`
+do
+	test_expect_success "ipfs add (and pin) a file" '
+		echo $i | ipfs add -q >> pins
+	'
+done
+
+test_expect_success "get pinset afterwards" '
+	ipfs pin ls --type=recursive -q | sort > rec_pins_after &&
+	cat pins rec_pins_before | sort | uniq > exp_pins_after &&
+	test_cmp rec_pins_after exp_pins_after
+'
+
+test_kill_ipfs_daemon
+
+test_done
+